Testing DSP cores based on self-test programs

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 1998, Pages 166-172

  Zhao, Wei ^a   Papachristou, Chris ^b  

^a Rockwell Semiconductor Systems   (United States)

^b CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA PATHS; DSP CORE; FAULT COVERAGES; PROGRAMMABLE CORES; RANDOM PATTERN; SELF-TEST; TESTABILITY;

TEST FACILITIES;

EID: 84893800745     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.1998.655852     Document Type: Conference Paper

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