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Volumn 43, Issue 3, 2014, Pages 519-529

Testing patent value indicators on directly observed patent value - An empirical analysis of Ocean Tomo patent auctions

Author keywords

Patent auctions; Patent value; Patent value indicators; Patents

Indexed keywords

COMMERCE;

EID: 84893673459     PISSN: 00487333     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.respol.2013.07.013     Document Type: Article
Times cited : (196)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.