The road to better reliability and yield embedded DfM tools

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2000, Pages 67-68

  Veelenturf, Kees ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DFM TOOLS; MANUFACTURABILITY; PHILIPS SEMICONDUCTORS; PROCESS MATURITY; TECHNOLOGY LEARNING;

EXHIBITIONS;

EID: 84893652443     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2000.840017     Document Type: Conference Paper

References (2)

1. W. Maly, "The future of IC design, testing, and manufacturing", IEEE Design & Test of Computers, pp. 8, 89-91 Winter 1996
2. F. Kuper, J. van der Pol, E. Ooms, R. Wijburg, W. Koster, D. Johnston, "Relation between yield and reliability of integrated circuits", Proceedings IRPS, pp. 17-21, 1996.