Relation between yield and reliability of integrated circuits: Experimental results and application to continuous early failure rate reduction programs

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1996, Pages 17-21

  Kuper, Fred ^a   van der Pol, Jacob ^a   Ooms, Eric ^a   Johnson, Tim ^a   Wijburg, Rutger ^a   Koster, Willem ^a   Johnston, Dave ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; FAILURE ANALYSIS; RELIABILITY; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SUBSTRATES;

CONTINUOUS EARLY FAILURE RATE REDUCTION PROGRAMS; ELECTRICAL OVERSTRESS; WAFER FABRICATION; YIELD FAILURES;

INTEGRATED CIRCUITS;

EID: 0029700580     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1996.492055     Document Type: Conference Paper

References (7)