850 nm oxide-VCSEL with low relative intensity noise and 40 Gb/s error free data transmission

IEEE Photonics Technology Letters

Volumn 26, Issue 3, 2014, Pages 289-292

  Tan, Fei ^a   Wu, Mong Kai ^a   Liu, Michael ^a   Feng, Milton ^a   Holonyak Jr , Nick ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

40 Gb s error free data transmission; ultralow laser relative intensity noise; VCSEL

Indexed keywords

ERROR-FREE DATA; LOW RELATIVE INTENSITY NOISE; MODULATION BANDWIDTH; OXIDE APERTURE; RELATIVE INTENSITY NOISE; ROOM TEMPERATURE; STANDARD QUANTUM LIMITS; THRESHOLD CURRENTS;

DATA COMMUNICATION SYSTEMS;

SURFACE EMITTING LASERS;

EID: 84893348948     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2013.2280726     Document Type: Article

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