A comprehensive black-box methodology for testing the forensic characteristics of solid-state drives

ACM International Conference Proceeding Series

Volumn , Issue , 2013, Pages 269-278

  Bonetti, Gabriele ^a   Viglione, Marco ^a   Frossi, Alessandro ^a   Maggi, Federico ^a   Zanero, Stefano ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BLACK-BOX METHODOLOGY; DATA OPTIMIZATION; DIRECT ACQUISITION; FORENSIC ANALYSIS; GARBAGE COLLECTION; MEMORY CELL; SOLID-STATE DRIVES; WEAR LEVELING;

BLACK-BOX TESTING; OPTIMIZATION; SECURITY OF DATA; SECURITY SYSTEMS; SEMICONDUCTOR STORAGE;

DIGITAL STORAGE;

EID: 84893245449     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2523649.2523660     Document Type: Conference Paper

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