Measurement of the electrical properties of a polycrystalline cadmium telluride for direct conversion flat panel x-ray detector

Journal of Instrumentation

Volumn 9, Issue 1, 2014, Pages

  Oh, K M ^a   Kim, D K ^a   Shin, J W ^a   Heo, S U ^a   Kim, J S ^a   Park, J G ^b   Nam, S H ^a  

^a Inje University   (South Korea)

^b International University of Korea   (South Korea)

Author keywords

Materials for solid state detectors; X ray detectors; X ray radiography and digital radiography (DR)

Indexed keywords

CHARGE COLLECTION EFFICIENCY; DIGITAL FLUOROSCOPY; DIGITAL RADIOGRAPHY; FLAT-PANEL X-RAY DETECTOR; HIGH QUANTUM EFFICIENCY; LARGE AREA DETECTOR; SOLID STATE DETECTORS; X-RAY DETECTOR;

CARRIER TRANSPORT; ELECTRIC PROPERTIES; SINGLE CRYSTALS; TRANSPORT PROPERTIES; X RAY APPARATUS; X RAYS;

CADMIUM TELLURIDE;

EID: 84893116977     PISSN: None     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/9/01/P01010     Document Type: Article

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