Study of structural and dielectric properties of copper oxide nanoparticles prepared by wet chemical precipitation method

International Journal of Nanoscience

Volumn 12, Issue 5, 2013, Pages

  Siddique, Kibriya ^a   Nath, Bhabesh Kumar ^b   Karmakar, Sanjib ^a  

^a GAUHATI UNIVERSITY   (India)

^b INSTITUTE OF ADVANCED STUDY IN SCIENCE AND TECHNOLOGY   (India)

Author keywords

dielectrics; Nanocrystalline material; X ray technique of structural crystallite size

Indexed keywords

CALCINATION TEMPERATURE; COMPLEX IMPEDANCE SPECTROSCOPY; COPPER OXIDE NANOPARTICLES; ENERGY DISPERSIVE X-RAY FLUORESCENCE; FUNCTION OF FREQUENCY; SELECTED AREA ELECTRON DIFFRACTION; WET-CHEMICAL PRECIPITATION; X-RAY TECHNIQUES;

COPPER OXIDES; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; NANOCRYSTALLINE MATERIALS; NANOPARTICLES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

PRECIPITATION (CHEMICAL);

EID: 84893049684     PISSN: 0219581X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219581X13500361     Document Type: Article

References (8)

1. V. A. Rozhkov, V. P. Goncharov and A. Y. Trusova, Electrical and photoelectrical properties of MIS structures with rare earch oxide lms as insulator, conduction and breakdown in solid dielectrics, Proc. IEEE 5th Int. Conf. Conduction and Break Down in Solid Dielectric (1995), pp. 552-555.
2. A. S. Lanje, S. J. Sharma, R. B. Pode and R. S. Ningthoujam, Adv. Appl. Sci. Res. 1, 36 (2010).
3. H. Wang, J.-Z. Xu, J.-J. Zhu and H.-Y. Chen, J. Cryst. Growth 244, 88 (2002).
4. L. Schmidt-Mende and J. L. M. Manus-Driscoll, Mater. Today 10, 40 (2007).
5. P. Thangbai, S. Tangwanchatoen and T. Yamwong, J. Phys. Condens. Matter 20, 395227 (2008).
6. Z. Jia, L. Yue, Y. Zheng and Z. Xu, Mater. Res. Bull. 43, 2434 (2008).
7. M. P. C. Kalita, K. Deka, J. Das, N. Hazarika, P. Dey, R. Das, S. Paul, T. Sarmah and B. K. Sarma, Mater. Lett. 87, 84 (2012).
8. A. A. Dakhel, J. Alloys Comp. 365, 233 (2004).