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Volumn 87, Issue , 2012, Pages 84-86

X-ray diffraction line profile analysis of chemically synthesized lead sulphide nanocrystals

Author keywords

Crystallite size; Dislocation density; Lattice strain; PbS nanocrystal; Structural; X ray techniques

Indexed keywords

DISLOCATION DENSITIES; LATTICE STRAIN; PBS NANOCRYSTAL; STRUCTURAL; X-RAY TECHNIQUES;

EID: 84865847765     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2012.07.098     Document Type: Article
Times cited : (33)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.