High pressure Raman spectroscopic study of phase transformation in TaO 2F

Vibrational Spectroscopy

Volumn 71, Issue , 2014, Pages 12-17

  Kamali, K ^a   Ravindran, T R ^a   Sairam, T N ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

High pressure; Negative thermal expansion; Raman spectroscopy; TaO2F

Indexed keywords

FIRST-ORDER RAMAN SCATTERING; HIGH PRESSURE; INCREASE IN PRESSURE; NEGATIVE THERMAL EXPANSION; TEMPERATURE-DEPENDENT RAMAN; THERMAL EXPANSION COEFFICIENTS; X-RAY DIFFRACTION STUDIES; ZERO THERMAL EXPANSION;

HARDENING; PHASE TRANSITIONS; RAMAN SPECTROSCOPY; SPECTROSCOPIC ANALYSIS; THERMAL EXPANSION; X RAY DIFFRACTION;

HIGH PRESSURE ENGINEERING;

EID: 84892920950     PISSN: 09242031     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vibspec.2013.12.009     Document Type: Article

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