Impact of annealing duration on spray pyrolysis deposited nanostructured zinc oxide thin films

Superlattices and Microstructures

Volumn 67, Issue , 2014, Pages 82-87

  Mani, Ganesh Kumar ^a   Rayappan, John Bosco Balaguru ^a  

^a SASTRA UNIVERSITY   (India)

Author keywords

Grain boundaries; Nanocrystalline materials; Recrystallization; Thin films; Zinc oxide

Indexed keywords

EFFECT OF ANNEALING; ELECTRICAL CONDUCTIVITY; HEXAGONAL WURTZITE STRUCTURE; NANOSTRUCTURED ZINC OXIDES; OPTICAL AND ELECTRICAL PROPERTIES; SCANNING ELECTRON MICROGRAPHS; SUBSTRATE TEMPERATURE; X-RAY DIFFRACTION DATA;

CRYSTALLIZATION; ELECTRIC PROPERTIES; GRAIN BOUNDARIES; GRAIN GROWTH; NANOCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SPRAY PYROLYSIS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE; ZINC SULFIDE;

ANNEALING;

EID: 84892770580     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2013.12.018     Document Type: Article

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