On least favorable configurations for step-up-down tests

Statistica Sinica

Volumn 24, Issue 1, 2014, Pages 1-23

  Blanchard, Gilles ^a   Dickhaus, Thorsten ^b   Roquain, Étienne ^c   Villers, Fanny ^c  

^a UNIVERSITY OF POTSDAM   (Germany)

^b HUMBOLDT UNIVERSITY   (Germany)

^c SORBONNE UNIVERSITÉ   (France)

Author keywords

False discovery rate; Least favorable configuration; Multiple testing; Steck's recursions; Step up down

Indexed keywords

EID: 84892754022     PISSN: 10170405     EISSN: None     Source Type: Journal    
DOI: 10.5705/ss.2011.205     Document Type: Review

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