On the false discovery rate and expected type I errors

Biometrical Journal

Volumn 43, Issue 8, 2001, Pages 985-1005

  Finner, Helmut ^a   Roters, M ^b  

^a HEINRICH HEINE UNIVERSITY   (Germany)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

Expected type I error rate; Familywise error rate; FDR; Multiple comparisons; Per comparison error rate; Per family error rate; Simes' test; Stepwise test procedure

Indexed keywords

ERROR ANALYSIS;

ERROR RATE; EXPECTED TYPE I ERROR RATE; FALSE DISCOVERY RATE; FAMILYWISE ERROR RATE; MULTIPLE COMPARISON; PER-COMPARISON ERROR RATE; PER-FAMILY ERROR RATE; SIMES' TEST; STEPWISE TEST PROCEDURE; TEST PROCEDURES; TYPE I ERROR RATE;

STATISTICAL TESTS;

EID: 0040970668     PISSN: 03233847     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4036(200112)43:8<985::AID-BIMJ985>3.0.CO;2-4     Document Type: Article

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