Direct observation of grain boundary migration during recrystallization within the bulk of a moderately deformed aluminium single crystal

Materials Transactions

Volumn 55, Issue 1, 2014, Pages 128-136

  Van Boxel, Steven ^a   Schmidt, Søren ^b   Ludwig, Wolfgang ^c   Zhang, Yu Bin ^b   Jensen, Dorte Juul ^b   Pantleon, Wolfgang ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^c UNIVERSITÉ DE LYON   (France)

Author keywords

Aluminium; Grain boundary migration; In situ characterization; Recrystallization; Synchrotron radiation; Topo tomography

Indexed keywords

ALUMINIUM SINGLE CRYSTALS; DIRECT OBSERVATIONS; EXPERIMENTAL CONDITIONS; GRAIN BOUNDARY MIGRATIONS; IN-SITU CHARACTERIZATION; LOCAL DEFORMATIONS; THICKNESS REDUCTION; TOPO-TOMOGRAPHY;

ALUMINUM; COLD ROLLING; CRYSTALLIZATION; GRAIN BOUNDARIES; RECRYSTALLIZATION (METALLURGY); SYNCHROTRON RADIATION; TOMOGRAPHY;

SINGLE CRYSTALS;

EID: 84892602647     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.M2013227     Document Type: Article

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