Extended interference matrices for exploded view of assembly planning

IEEE Transactions on Automation Science and Engineering

Volumn 11, Issue 1, 2014, Pages 279-286

  Yu, Jiapeng ^a   Xu, Li Da ^a   Bi, Zhuming ^b   Wang, Chengen ^a  

^a STATE KEY LABORATORY OF SYNTHETICAL AUTOMATION FOR PROCESS INDUSTRIES   (China)

^b INDIANA UNIVERSITY PURDUE UNIVERSITY FORT WAYNE   (United States)

Author keywords

Assembly model; Assembly sequence planning (ASP); Contact connection matrix; Digital assembly planning; Enterprise systems; Exploded views; Extended interference matrix (EIM); Interference detection

Indexed keywords

ASSEMBLY MODEL; ASSEMBLY SEQUENCE PLANNING; DIGITAL ASSEMBLY; ENTERPRISE SYSTEM; EXPLODED VIEWS; INTERFERENCE DETECTION; INTERFERENCE MATRIX;

APPLICATION PROGRAMMING INTERFACES (API); APPLICATION PROGRAMS; ASSEMBLY;

COMPUTER AIDED DESIGN;

EID: 84892445931     PISSN: 15455955     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASE.2012.2235144     Document Type: Article

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