SCOPUS 정보 검색 플랫폼

Volumn 4, Issue 10, 2014, Pages 5036-5045

Correlation between electrochromism and electronic structures of tungsten oxide films

(15) Limaye, Mukta V a Chen, J S a,d Singh, Shashi B a Shao, Y C a Wang, Y F a Pao, C W b Tsai, H M b Lee, J F b Lin, H J b Chiou, J W c Yang, M C d Wu, W T d Wu, J J d Tsai, M H e Pong, W F a

a TAMKANG UNIVERSITY (Taiwan)

b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER (Taiwan)

c NATIONAL UNIVERSITY OF KAOHSIUNG (Taiwan)

d NATIONAL CHENG KUNG UNIVERSITY (Taiwan)

e NATIONAL SUN YAT SEN UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTION-BAND STATE; CRYSTALLINE SAMPLES; ELECTROCHROMIC PROPERTIES; EXTENDED X-RAY ABSORPTION FINE STRUCTURE ANALYSIS; IN-SITU X-RAY ABSORPTION SPECTROSCOPY; STRUCTURAL DISORDERING; TUNGSTEN OXIDE FILMS; X-RAY ABSORPTION NEAR-EDGE STRUCTURE;

BLEACHING; CLEANING; CONDUCTION BANDS; CRYSTALLINE MATERIALS; ELECTRONIC STRUCTURE; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; OXIDE FILMS; OXIDES; SUPERCOMPUTERS; X RAY ABSORPTION SPECTROSCOPY;

TUNGSTEN COMPOUNDS;

EID: 84891777131 PISSN: None EISSN: 20462069 Source Type: Journal
DOI: 10.1039/c3ra45421e Document Type: Article

Times cited : (32)

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