The effects of device geometry and TCO/buffer layers on damp heat accelerated lifetime testing of Cu(In,Ga)Se2 solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue PART 2, 2012, Pages

  Thompson, Christopher P ^a   Hegedus, Steve ^a   Carcia, Peter ^b   McLean, R Scott ^b  

^a UNIVERSITY OF DELAWARE   (United States)

^b DUPONT COMPANY   (United States)

Author keywords

Accelerated aging; life testing; photovoltaic (PV) cells; thin film devices

Indexed keywords

ACCELERATED AGING; ACCELERATED LIFETIME TESTING; INITIAL EFFICIENCY; LIFE-TESTING; PHOTOVOLTAIC; POLYETHYLENE TEREPHTHALATES (PET); TRANSPARENT CONDUCTING OXIDE; WATER VAPOR TRANSMISSION RATE;

EFFICIENCY; GALLIUM; GLASS; SOLAR CELLS; THIN FILM DEVICES; ZINC OXIDE;

SELENIUM COMPOUNDS;

EID: 84891333910     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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