Analysis of optical thickness determination of materials by THz-TDS

Journal of Physics: Conference Series

Volumn 472, Issue 1, 2013, Pages

  Sushko, O ^a   Dubrovka, R ^a   Donnan, R S ^a  

^a QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; LASER PULSES;

DIELECTRIC RESPONSE; EXTRACTION PROCEDURE; MULTIPLE INTERNAL REFLECTIONS; OPTICAL PARAMETER; OPTICAL THICKNESS; SAMPLE THICKNESS; THICKNESS DETERMINATION; TIME DOMAIN RESPONSE;

TIME DOMAIN ANALYSIS;

EID: 84891135144     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/472/1/012005     Document Type: Conference Paper

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