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Volumn , Issue , 2009, Pages 189-205

X-Ray Structural Studies of Low and High Molecular Weight Poly(3-Hexylthiophene)

Author keywords

LMW fraction; Low and high molecular weight poly(3 hexylthiophene); Structure determination; Temperature dependent measurements; X ray crystallinity studies; X ray structural studies

Indexed keywords


EID: 84890986759     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527627387.ch10     Document Type: Chapter
Times cited : (1)

References (33)
  • 25
    • 13744257636 scopus 로고    scopus 로고
    • High-resolution X-ray Diffraction from Thin Films and Lateral Nanostructures
    • Springer, Berlin
    • U. Pietsch, V. Holy, and T. Baumbach, High-resolution X-ray Diffraction from Thin Films and Lateral Nanostructures, (Springer, Berlin, 2005).
    • (2005)
    • Pietsch, U.1    Holy, V.2    Baumbach, T.3
  • 28
    • 0004148028 scopus 로고
    • Structural Investigation of Polymers
    • Ellis Horwood Ltd., Chichester, West Sussex, England
    • G. Boder, Structural Investigation of Polymers (Ellis Horwood Ltd., Chichester, West Sussex, England, 1991).
    • (1991)
    • Boder, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.