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Volumn , Issue , 2013, Pages
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Characterization of integrated bragg grating profiles
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Author keywords
[No Author keywords available]
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Indexed keywords
GRATING PROFILE;
HIGH SPATIAL FREQUENCY;
LAYER PEELING;
PARASITIC REFLECTIONS;
PHASE PROFILE;
SPECTRAL RESPONSE;
WAFER THICKNESS;
GLASS;
LIGHT SENSITIVE MATERIALS;
PHOTOSENSITIVITY;
SILICON WAFERS;
WAVEGUIDES;
BRAGG GRATINGS;
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EID: 84890735503
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (5)
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