Direct measurement of band offset at the interface between CdS and Cu 2ZnSnS4 using hard X-ray photoelectron spectroscopy

Applied Physics Letters

Volumn 103, Issue 24, 2013, Pages

  Tajima, Shin ^a   Kataoka, Keita ^a   Takahashi, Naoko ^a   Kimoto, Yasuji ^a   Fukano, Tatsuo ^a   Hasegawa, Masaki ^a   Hazama, Hirofumi ^a  

^a Rd Management Section   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAP ENERGY; BURIED INTERFACE; CONDUCTION BAND OFFSET; DIRECT MEASUREMENT; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; VALENCE BAND OFFSETS; VALENCE BAND SPECTRA; X-RAY PHOTON ENERGY;

HETEROJUNCTIONS; PHOTOELECTRONS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

CADMIUM SULFIDE;

EID: 84890524418     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4850235     Document Type: Article

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