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Volumn 3, Issue 4, 2013, Pages 424-439

Insights on the study of nafion nanoscale morphology by transmission electron microscopy

Author keywords

Electron beam damage; Electron microscopy; Nafion

Indexed keywords

ELECTRON BEAMS; ELECTRON MICROSCOPY; IRRADIATION; MEMBRANES; PHASE SEPARATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84890511729     PISSN: None     EISSN: 20770375     Source Type: Journal    
DOI: 10.3390/membranes3040424     Document Type: Article
Times cited : (30)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.