Disordered spheres with extensive overlap in projection: Image simulation and analysis

Microscopy and Microanalysis

Volumn 17, Issue 6, 2011, Pages 872-878

  Chan, Christopher D ^a   Seitz, Michelle E ^a   Winey, Karen I ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

image simulation; nanocomposites; nanoparticles; projection; TEM

Indexed keywords

NANOCOMPOSITE; NANOSPHERE;

ARTICLE; COMPUTER PROGRAM; FOURIER ANALYSIS; IMAGE PROCESSING; METHODOLOGY; PARTICLE SIZE; TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE;

FOURIER ANALYSIS; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, TRANSMISSION; NANOCOMPOSITES; NANOSPHERES; PARTICLE SIZE; SOFTWARE;

EID: 82055168973     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611012190     Document Type: Article

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