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Volumn 119, Issue , 2014, Pages 553-563
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Chemometrics-assisted simultaneous voltammetric determination of ascorbic acid, uric acid, dopamine and nitrite: Application of non-bilinear voltammetric data for exploiting first-order advantage
a
RAZI UNIVERSITY
(Iran)
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Author keywords
Ascorbic acid; Dopamine; Linear and non linear multivariate calibration models; Nitrite; Simultaneous determination; Uric acid
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Indexed keywords
AMINES;
BACKPROPAGATION ALGORITHMS;
CALIBRATION;
DISCRETE WAVELET TRANSFORMS;
GENETIC ALGORITHMS;
GLASS MEMBRANE ELECTRODES;
LEAST SQUARES APPROXIMATIONS;
LINEAR REGRESSION;
MIXTURES;
MULTIVARIABLE SYSTEMS;
NEUROPHYSIOLOGY;
RADIAL BASIS FUNCTION NETWORKS;
SPLINES;
SUPPORT VECTOR MACHINES;
DOPAMINE;
MULTIVARIATE CALIBRATION;
NITRITE;
SIMULTANEOUS DETERMINATIONS;
URIC ACIDS;
ASCORBIC ACID;
ASCORBIC ACID;
DOPAMINE;
MVC;
NITRITE;
URIC ACID;
AA;
ALGORITHM;
ARTICLE;
ASLSSR;
ASYMMETRIC LEAST SQUARES SPLINES REGRESSION;
BACK PROPAGATION-ARTIFICIAL NEURAL NETWORK;
BLOOD;
BP-ANN;
CALIBRATION;
CHEMICAL MODEL;
CONTINUUM POWER REGRESSION;
CORRELATION OPTIMIZED WARPING;
COW;
CPR;
DISCRETE WAVELET TRANSFORM-ARTIFICIAL NEURAL NETWORK;
DP;
DWT-ANN;
ELECTROCHEMICAL ANALYSIS;
GA;
GCE;
GENETIC ALGORITHM;
GLASSY CARBON ELECTRODE;
HUMAN;
LATENT VARIABLES;
LEAST SQUARES-SUPPORT VECTOR MACHINES;
LEAVE ONE OUT CROSS-VALIDATION;
LINEAR AND NON-LINEAR MULTIVARIATE CALIBRATION MODELS;
LOO-CV;
LS-SVM;
LVS;
MC;
MEAN CENTERING;
METHODOLOGY;
MLR;
MULTIPLE LINEAR REGRESSION ANALYSIS;
MULTIVARIATE CALIBRATION;
NT;
ORTHOGONAL SIGNAL CORRECTION;
OSC;
PARTIAL LEAST SQUARES-1;
PARTIAL ROBUST M-REGRESSION;
PDC;
PERCENTAGE OF DATA CONTAMINATION;
PH;
PLS-1;
PLY-PLS;
POLYNOMIAL-PARTIAL LEAST SQUARES;
PREDICTION RESIDUAL ERROR SUM OF SQUARES;
PRESS;
PRM;
Q(2);
RADIAL BASIS FUNCTION-PARTIAL LEAST SQUARES;
RBF-PLS;
RCR;
RELATIVE ERROR OF PREDICTION;
REP;
RMC;
RMSECV;
RMSEP;
ROBUST CONTINUUM REGRESSION;
ROBUST MEDIAN CENTERING;
ROBUST PRINCIPAL COMPONENT ANALYSIS, MLP, MULTILAYER PERCEPTRON;
ROOT MEAN SQUARE ERRORS OF PREDICTION;
ROOT MEAN SQUARED ERRORS OF CROSS-VALIDATION;
RPCA;
SAVITSKY-GOLAY SMOOTHING;
SGS;
SIMPLEX LATTICE DESIGN;
SIMULTANEOUS DETERMINATION;
SLD;
SPA;
SPL-PLS;
SPLINE-PARTIAL LEAST SQUARES;
SQUARE WAVE VOLTAMMETRY;
SUCCESSIVE PROJECTIONS ALGORITHM;
SUPPORT VECTOR MACHINE;
SWV;
THE SQUARE CORRELATION COEFFICIENT OF CROSS-VALIDATION;
UA;
VALIDATION STUDY;
WAVELET DENOISING;
WAVELET TRANSFORM-ARTIFICIAL NEURAL NETWORK;
WD;
WT-ANN;
AA;
ASCORBIC ACID;
ASLSSR;
ASYMMETRIC LEAST SQUARES SPLINES REGRESSION;
BACK PROPAGATION-ARTIFICIAL NEURAL NETWORK;
BP-ANN;
CONTINUUM POWER REGRESSION;
CORRELATION OPTIMIZED WARPING;
COW;
CPR;
DISCRETE WAVELET TRANSFORM-ARTIFICIAL NEURAL NETWORK;
DOPAMINE;
DP;
DWT-ANN;
GA;
GCE;
GENETIC ALGORITHM;
GLASSY CARBON ELECTRODE;
LATENT VARIABLES;
LEAST SQUARES-SUPPORT VECTOR MACHINES;
LEAVE ONE OUT CROSS-VALIDATION;
LINEAR AND NON-LINEAR MULTIVARIATE CALIBRATION MODELS;
LOO-CV;
LS-SVM;
LVS;
MC;
MEAN CENTERING;
MLR;
MULTIPLE LINEAR REGRESSION;
MULTIVARIATE CALIBRATION;
MVC;
NITRITE;
NT;
ORTHOGONAL SIGNAL CORRECTION;
OSC;
PARTIAL LEAST SQUARES-1;
PARTIAL ROBUST M-REGRESSION;
PDC;
PERCENTAGE OF DATA CONTAMINATION;
PLS-1;
PLY-PLS;
POLYNOMIAL-PARTIAL LEAST SQUARES;
PREDICTION RESIDUAL ERROR SUM OF SQUARES;
PRESS;
PRM;
Q(2);
RADIAL BASIS FUNCTION-PARTIAL LEAST SQUARES;
RBF-PLS;
RCR;
RELATIVE ERROR OF PREDICTION;
REP;
RMC;
RMSECV;
RMSEP;
ROBUST CONTINUUM REGRESSION;
ROBUST MEDIAN CENTERING;
ROBUST PRINCIPAL COMPONENT ANALYSIS, MLP, MULTILAYER PERCEPTRON;
ROOT MEAN SQUARE ERRORS OF PREDICTION;
ROOT MEAN SQUARED ERRORS OF CROSS-VALIDATION;
RPCA;
SAVITSKY-GOLAY SMOOTHING;
SGS;
SIMPLEX LATTICE DESIGN;
SIMULTANEOUS DETERMINATION;
SLD;
SPA;
SPL-PLS;
SPLINE-PARTIAL LEAST SQUARES;
SQUARE WAVE VOLTAMMETRY;
SUCCESSIVE PROJECTIONS ALGORITHM;
SWV;
THE SQUARE CORRELATION COEFFICIENT OF CROSS-VALIDATION;
UA;
URIC ACID;
WAVELET DENOISING;
WAVELET TRANSFORM-ARTIFICIAL NEURAL NETWORK;
WD;
WT-ANN;
ALGORITHMS;
ASCORBIC ACID;
CALIBRATION;
DOPAMINE;
ELECTROCHEMICAL TECHNIQUES;
HUMANS;
HYDROGEN-ION CONCENTRATION;
MODELS, CHEMICAL;
NITRITES;
SUPPORT VECTOR MACHINES;
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EID: 84890284241
PISSN: 00399140
EISSN: None
Source Type: Journal
DOI: 10.1016/j.talanta.2013.11.028 Document Type: Article |
Times cited : (47)
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References (44)
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