Measurement uncertainties of size, shape, and surface measurements using transmission electron microscopy of near-monodisperse, near-spherical nanoparticles

Journal of Nanoparticle Research

Volumn 16, Issue 1, 2014, Pages

  De Temmerman, Pieter Jan ^a,b   Lammertyn, Jeroen ^b   De Ketelaere, Bart ^b   Kestens, Vikram ^c   Roebben, Gert ^c   Verleysen, Eveline ^a   Mast, Jan ^a  

^a VETERINARY AND AGROCHEMICAL RESEARCH CENTRE   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c JOINT RESEARCH CENTRE   (Italy)

Author keywords

Measurement uncertainty; Method validation; Nanometrology; Reference material; Silica nanoparticles; Transmission electron microscopy

Indexed keywords

MEASUREMENT UNCERTAINTY; METHOD VALIDATIONS; NANOMETROLOGY; REFERENCE MATERIAL; SILICA NANOPARTICLES;

DATA PROCESSING; IMAGE ANALYSIS; PARTICLE SIZE ANALYSIS; SURFACE MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

UNCERTAINTY ANALYSIS;

NANOPARTICLE; SILICA NANOPARTICLE; SILICON DIOXIDE; UNCLASSIFIED DRUG;

ACCURACY; ARTICLE; CALIBRATION; DATA ANALYSIS; DATA PROCESSING; DISCRIMINANT ANALYSIS; IMAGE ANALYSIS; PARTICLE SIZE; PRIORITY JOURNAL; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY; VALIDATION STUDY;

EID: 84890253007     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-013-2177-1     Document Type: Article

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