The upgraded LTP-V at SLS

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 710, Issue , 2013, Pages 13-16

  Flechsig, U ^a   Jaggi, A ^a   Krempasky J ^a   Spielmann, S ^a   Thominet, V ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

EPICS; LTP; Metrology; Slope error

Indexed keywords

CALIBRATION; CCD CAMERAS; IMAGE PROCESSING; LIGHT SOURCES; MEASUREMENTS; OPTICAL DATA PROCESSING; PIXELS; UNITS OF MEASUREMENT;

COMPATIBLE SYSTEMS; EPICS; GIGABIT ETHERNET; LONG TRACE PROFILER; MEASUREMENT EFFICIENCY; SLOPE ERRORS; SWISS LIGHT SOURCES; SYNCHROTRON OPTICS;

ADAPTIVE OPTICS;

EID: 84888859002     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2012.10.114     Document Type: Article

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