Characterization of Cu2-xSe thin films synthesized from electrochemical deposition

Materials Science and Engineering: B

Volumn 180, Issue 1, 2014, Pages 33-37

  Liu, Tung Cheng ^a   Hu, Yi ^a   Chang, Wen Bing ^b  

^a TATUNG UNIVERSITY   (Taiwan)

^b TECHNOLOGY AND SCIENCE INSTITUTE OF NORTHERN TAIWAN   (Taiwan)

Author keywords

Copper selenide; Electrochemical deposition; Semiconductor; Thin film

Indexed keywords

CONDUCTIVE FILMS; COPPER COMPOUNDS; ELECTROCHEMICAL DEPOSITION; ENERGY GAP; FILM GROWTH; MICROSTRUCTURE; NANOPARTICLES; REDUCTION; SOLUTIONS; SUBSTRATES; SULFUR COMPOUNDS; THIN FILMS;

DEPOSITION POTENTIAL; ELECTROCHEMICAL DEPOSITION; FACE-CENTRED CUBIC; GRAIN GROWING; HRTEM ANALYSIS; MOLYBDENUM SUBSTRATE; PLATE-LIKE GRAINS; SYNTHESISED; THIN-FILMS; XPS ANALYSIS;

SELENIUM COMPOUNDS;

EID: 84888588168     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2013.10.012     Document Type: Article

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