High-resolution 1D moiré s as counterfeit security features

Light: Science and Applications

Volumn 2, Issue JULY, 2013, Pages

  Cadarso, Victor J ^a   Chosson, Sylvain ^a   Sidler, Katrin ^a   Hersch, Roger D ^a   Brugger, Jürgen ^a  

^a EPFL   (Switzerland)

Author keywords

Anti counterfeiting; Micro optical devices; Moir effect; Optical security

Indexed keywords

EID: 84888580929     PISSN: None     EISSN: 20477538     Source Type: Journal    
DOI: 10.1038/lsa.2013.42     Document Type: Article

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