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Volumn 731, Issue , 2013, Pages 68-73
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EIGER characterization results
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Author keywords
CMOS electronics; Photon counting; Pixel detectors; Synchrotron radiation instrumentation
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Indexed keywords
DETECTOR CALIBRATION;
PERFORMANCE MEASUREMENTS;
PHOTON COUNTING;
PIXEL DETECTOR;
PROTEIN CRYSTALLOGRAPHY;
SMALL ANGLE X-RAY SCATTERING;
SWISS LIGHT SOURCES;
SYNCHROTRON RADIATION INSTRUMENTATION;
PHOTONS;
READOUT SYSTEMS;
DETECTORS;
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EID: 84888338543
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2013.04.047 Document Type: Article |
Times cited : (31)
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References (15)
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