Deriving leaf mass per area (LMA) from foliar reflectance across a variety of plant species using continuous wavelet analysis

ISPRS Journal of Photogrammetry and Remote Sensing

Volumn 87, Issue , 2014, Pages 28-38

  Cheng, Tao ^a   Rivard, Benoit ^b   Sánchez Azofeifa, Arturo G ^b,c   Féret, Jean Baptiste ^d   Jacquemoud, Stéphane ^e   Ustin, Susan L ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF ALBERTA   (Canada)

^c SMITHSONIAN TROPICAL RESEARCH INSTITUTE   (Panama)

^d GEOPHYSICAL LABORATORY   (United States)

^e INSTITUT DE PHYSIQUE DU GLOBE DE PARIS   (France)

Author keywords

Dry matter content; Leaf mass per area; PROSPECT model; Remote sensing; Specific leaf area; Wavelet analysis

Indexed keywords

DATABASE SYSTEMS; INFORMATION USE; OPTICAL PROPERTIES; PHOTOMAPPING; PLANTS (BOTANY); REFLECTION; REMOTE SENSING; WATER ABSORPTION; WAVELET ANALYSIS;

CONTINUOUS WAVELET ANALYSIS; DRY MATTER CONTENT; INDEPENDENT MEASUREMENT; LEAF MASS PER AREA; NORMALIZED DIFFERENCE INDICES; PROSPECT MODEL; REFLECTANCE SPECTROSCOPY; SPECIFIC LEAF AREA;

PREDICTIVE ANALYTICS;

ABSORPTION; DATABASE; ECOLOGICAL MODELING; LEAF MORPHOLOGY; NUMERICAL MODEL; REFLECTANCE; REMOTE SENSING; SPECTRAL ANALYSIS; WAVELET ANALYSIS;

EID: 84888266742     PISSN: 09242716     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.isprsjprs.2013.10.009     Document Type: Article

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