K2: A Super-Resolution Electron Counting Direct Detection Camera for Cryo-EM

Microscopy and Microanalysis

Volumn 18, Issue S2, 2012, Pages 78-79

  Booth, C R ^a   Mooney, P E ^a   Lee, B C ^a   Lent, M ^a   Gubbens, A J ^a  

^a GATAN INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84888092566     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612002243     Document Type: Article

References (3)

1. Turchetta, R., et al., “A monolithic active pixel sensor for charged particle tracking and imaging using standard VLSI CMOS technology,” Nucl. Instr. and Meth. A 458 (2001).
2. Denes, P. et al., “A rad-hard CMOS active pixel sensor for electron microscopy”, Nucl. Instr. and Meth. A, 598 (2009).
3. Contarato, D., “Direct detection in Transmission Electron Microscopy with a 5 µm pitch CMOS pixel sensor,” et al., Nucl. Instr. and Meth. A 635 (2011).