Consolidated product line variability modeling

Software Product Lines: Research Issues in Engineering and Management

Volumn , Issue , 2006, Pages 195-241

  Bayer, Joachim ^a   Gerard, Sebastien ^b   Haugen, Oystein ^c   Mansell, Jason ^d   Møller Pedersen, Birger ^c   Oldevik, Jon ^e   Tessier, Patrick ^f   Thibault, Jean Philippe ^b   Widen, Tanya ^g  

^a FRAUNHOFER IESE   (Germany)

^b CEA SACLAY   (France)

^c UNIVERSITY OF OSLO   (Norway)

^d TECNALIA RESEARCH AND INNOVATION   (Spain)

^e SINTEF ICT   (Norway)

^f INRIA   (France)

^g Nokia Research Center 407   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84887967350     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-3-540-33253-4_6     Document Type: Chapter

References (29)

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