Crystalline domain size and faulting in the new NIST SRM 1979 zinc oxide

Powder Diffraction

Volumn 28, Issue SUPPL.2, 2013, Pages

  Cline, J P ^a   Leoni, M ^c   Black, D ^a   Henins, A ^a   Bonevich, J E ^a   Whitfield, P S ^b   Scardi, P ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^c UNIVERSITY OF TRENTO   (Italy)

Author keywords

Line Profile Analysis; NIST; SRM 1979

Indexed keywords

CRYSTALLINE DOMAINS; LINE PROFILE ANALYSIS; MICRO-STRUCTURAL; NIST; PROCESSING PARAMETERS; SMALL ASPECT RATIO; SRM 1979; WHOLE POWDER PATTERN MODELING;

TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

CRYSTALLINE MATERIALS;

EID: 84887927257     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S0885715613001188     Document Type: Conference Paper

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