Quantification of deep traps in nanocrystal solids, their electronic properties, and their influence on device behavior

Nano Letters

Volumn 13, Issue 11, 2013, Pages 5284-5288

  Bozyigit, Deniz ^a   Volk, Sebastian ^a   Yarema, Olesya ^a   Wood, Vanessa ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

Deep level transient spectroscopy (DLTS); Fourier transform photocurrent spectroscopy (FTPS); PbS; photovoltaics; quantum dots; thermal admittance spectroscopy (TAS)

Indexed keywords

COMPLEMENTARY TECHNIQUES; DEEP TRAPS; MULTI-TECHNIQUE APPROACH; PBS; PHOTOCURRENT SPECTROSCOPY; PHOTOVOLTAICS; THERMAL ADMITTANCE SPECTROSCOPY; TRAP STATE;

DEEP LEVEL TRANSIENT SPECTROSCOPY; NANOCRYSTALS; SEMICONDUCTOR QUANTUM DOTS;

ELECTRONIC PROPERTIES;

EID: 84887828910     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl402803h     Document Type: Article

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