Uncertainty characterization of particle depth measurement using digital in-line holography and the hybrid method

Optics Express

Volumn 21, Issue 22, 2013, Pages 26432-26449

  Gao, Jian ^a   Guildenbecher, Daniel R ^b   Reu, Phillip L ^b   Chen, Jun ^a  

^a Purdue University   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

UNCERTAINTY ANALYSIS;

DEPTH DETERMINATION; DIGITAL IN-LINE HOLOGRAPHIES; MEASUREMENT ACCURACY; MEASUREMENT PROBLEMS; PARTICLE CONDITIONS; PARTICLE DETECTION; PARTICLE DIAMETERS; UNCERTAINTY CHARACTERIZATION;

HOLOGRAMS;

NANOPARTICLE;

ALGORITHM; ARTICLE; AUTOMATED PATTERN RECOGNITION; COMPUTER ASSISTED DIAGNOSIS; HOLOGRAPHY; IMAGE ENHANCEMENT; METHODOLOGY; MOLECULAR IMAGING; ONLINE SYSTEM; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ALGORITHMS; HOLOGRAPHY; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MOLECULAR IMAGING; NANOPARTICLES; ONLINE SYSTEMS; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 84887424760     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.026432     Document Type: Conference Paper

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