Focus plane detection criteria in digital holography microscopy by amplitude analysis

Optics Express

Volumn 14, Issue 13, 2006, Pages 61-74

  Dubois, Frank ^a   Schockaert, Cédric ^a   Callens, Natacha ^a   Yourassowsky, Catherine ^a  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING; IMAGE RECONSTRUCTION; MICROSCOPIC EXAMINATION; OPTICAL ENGINEERING;

AMPLITUDE ANALYSIS; DIGITAL HOLOGRAMS; HOLOGRAPHIC RECONSTRUCTION; INTEGRATED AMPLITUDE MODULUS;

HOLOGRAPHY;

EID: 33745458778     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: None     Document Type: Article

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