Feature selection for high-dimensional industrial data

ESANN 2005 Proceedings - 13th European Symposium on Artificial Neural Networks

Volumn , Issue , 2007, Pages 375-380

  Bensch, Michael ^a   Schr̈oder, Michael ^a   Bogdan, Martin ^a   Rosenstiel, Wolfgang ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FABRICATION PROCESS; HIGH-DIMENSIONAL; INDUSTRIAL DATUM; MANUFACTURING PROCESS; SEMICONDUCTOR INDUSTRY;

QUALITY ASSURANCE; SEMICONDUCTOR DEVICE MANUFACTURE;

NEURAL NETWORKS;

EID: 84886998938     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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