Chiral metamaterials: Retrieval of the effective parameters with and without substrate

Optics Express

Volumn 18, Issue 14, 2010, Pages 14553-14567

  Zhao, Rongkuo ^a,b   Koschny, Thomas ^a,c   Soukoulis, Costas M ^a,c  

^a IOWA STATE UNIVERSITY   (United States)

^b BEIJING NORMAL UNIVERSITY   (China)

^c INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

REFRACTION; SURFACE PLASMON RESONANCE; TRANSFER MATRIX METHOD; WAVE PROPAGATION;

CHIRAL METAMATERIALS; DIFFERENCE FREQUENCY; EFFECTIVE CONSTITUTIVE PARAMETERS; EFFECTIVE PARAMETERS; FORWARD-AND-BACKWARD; NEGATIVE REFRACTIONS; RETRIEVAL PROCEDURES; TRANSFER MATRIX TECHNIQUE;

METAMATERIALS;

EID: 84886947084     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.014553     Document Type: Article

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