Silver nanocrystals of various morphologies deposited on silicon wafer and their applications in ultrasensitive surface-enhanced Raman scattering

Materials Characterization

Volumn 85, Issue , 2013, Pages 48-56

  Chen, Limiao ^a   Jing, Qifeng ^a   Chen, Jun ^a   Wang, Bodong ^a   Huang, Jianhan ^a   Liu, Younian ^a  

^a CENTRAL SOUTH UNIVERSITY   (China)

Author keywords

Melamine; Morphology; Silver; Surface enhanced Raman scattering

Indexed keywords

ENERGY DISPERSIVE X-RAY; IRREGULAR MORPHOLOGY; MORPHOLOGICAL EVOLUTION; POLY VINYL PYRROLIDONE; SILICON SUBSTRATES; SILVER NANOCRYSTALS; SILVER NANOSTRUCTURES; SURFACE ENHANCED RAMAN SCATTERING (SERS);

MELAMINE; MORPHOLOGY; NANOSTRUCTURES; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SURFACE SCATTERING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

SILVER;

EID: 84886618587     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2013.09.001     Document Type: Article

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