Thermal destruction testing: An indirect approach to a simple dynamic thermal model of smart power switches

European Solid-State Circuits Conference

Volumn , Issue , 2001, Pages 221-224

  Glavanovics, M ^a   Zitta, H ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DESTRUCTIVE TESTING; DYNAMIC THERMAL MODELING; INDIRECT METHODS; POWER APPLICATIONS; POWER SWITCHES; THEORETICAL MODELING; THERMAL DESTRUCTION; THERMAL SIMULATIONS;

COMPUTER SIMULATION;

TIME SWITCHES;

EID: 84885861911     PISSN: 19308833     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. P. E. Bagnoli, C. Casora, E. Dallago, M. Nardoni, "Thermal Resistance Analysis by Induced Transient (TRAIT) Method for Power Electronic Devices Thermal Characterization (Part 1 and 2)" IEEE Transactions on Power Electronics, Vol.13, No.6, Nov.1998, pp. 1208-1228
2. Gustav Doetsch, "Anleitung zum praktischen Gebrauch der Laplace-Transformation und der Z-Transformation", R. Oldenbourg Verlag München, 3.Auflage 1967
3. S. Merchant et al., "Energy Capability of Lateral and Vertical DMOS Transistors in an Advanced Automotive Smart Power Technology", IEEE ISPSD’98, pp. 317-320
4. C. Preuschoff, "Quad, Octal and 16-fold Smart Power Low-Side Switches for Automotive Engine Management/Powertrain Applications (TLE62x0)", Infineon Technologies App. Note 01/1998, www.infineon.com
5. M. März, P. Nance, "Thermal Modeling of Powerelectronic Systems", Infineon Technologies Application Note 05/2000, www.infineon.com