Structural and magnetic properties of biaxially textured NiFe 2O4 thin films grown on c-plane sapphire

Journal of Applied Physics

Volumn 112, Issue 12, 2012, Pages

  Seifikar, Safoura ^a   Calandro, Bridget ^a,b   Deeb, Elisabeth ^c   Sachet, Edward ^a   Yang, Jijin ^d   Maria, Jon Paul ^a   Bassiri Gharb, Nazanin ^c,e   Schwartz, Justin ^a  

^a North Carolina State University   (United States)

^b University of Missouri Rolla   (United States)

^c GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^d CARL ZEISS SMT AG   (Germany)

^e Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; IRON COMPOUNDS; MAGNETIC ANISOTROPY; NICKEL COMPOUNDS; PULSED LASER DEPOSITION; SAPPHIRE; TEXTURES; THICK FILMS;

CHEMICAL SOLUTION DEPOSITION; CRYSTALLOGRAPHIC VARIANTS; EPITAXIAL RELATIONSHIPS; OUT-OF-PLANE COERCIVITY; OUT-OF-PLANE MAGNETIC ANISOTROPY; OUT-OF-PLANE ORIENTATION; SAPPHIRE SUBSTRATES; STRUCTURAL AND MAGNETIC PROPERTIES;

THIN FILMS;

EID: 84885602584     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4770366     Document Type: Article

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