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Volumn , Issue , 2013, Pages 1277-1280

Reverse engineering digital circuits using functional analysis

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CIRCUITS; MALWARE; TIMING CIRCUITS;

EID: 84885590301     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.7873/date.2013.264     Document Type: Conference Paper
Times cited : (82)

References (16)
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  • 7
    • 0033359923 scopus 로고    scopus 로고
    • Unveiling the ISCAS-85 benchmarks: A case study in reverse engineering
    • M.C. Hansen, H. Yalcin, and J.P. Hayes. Unveiling the ISCAS-85 Benchmarks: A Case Study in Reverse Engineering. IEEE Design & Test of Comp., 16(3):72-80, 1999.
    • (1999) IEEE Design & Test of Comp. , vol.16 , Issue.3 , pp. 72-80
    • Hansen, M.C.1    Yalcin, H.2    Hayes, J.P.3
  • 8
    • 51849095999 scopus 로고    scopus 로고
    • Hardware trojan detection using path delay fingerprint
    • Y. Jin and Y. Makris. Hardware Trojan Detection Using Path Delay Fingerprint. In Proc. of HOST 2008.
    • Proc. of HOST 2008
    • Jin, Y.1    Makris, Y.2
  • 9
    • 84864117075 scopus 로고    scopus 로고
    • Reverse engineering circuits using behavioral pattern mining
    • W. Li, Z. Wasson, and S. A. Seshia. Reverse Engineering Circuits Using Behavioral Pattern Mining. In Proc. of HOST 2012.
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    • Li, W.1    Wasson, Z.2    Seshia, S.A.3
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    • Permutation and phase independent Boolean comparison
    • December
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    • Mohnke, J.1    Malik, S.2
  • 15
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    • The state-of-the-art in IC reverse engineering
    • R. Torrance and D. James. The State-of-the-Art in IC Reverse Engineering. In Proc. of CHES 2009, 2009.
    • (2009) Proc. of CHES 2009
    • Torrance, R.1    James, D.2
  • 16
    • 67649998710 scopus 로고    scopus 로고
    • Hardware trojan detection and isolation using current integration and localized current analysis
    • X. Wang, H. Salmani, M. Tehranipoor, and J. Plusquellic. Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis. In Proc. of DFT 2008, 2008.
    • (2008) Proc. of DFT 2008
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.