SCOPUS 정보 검색 플랫폼

Volumn 546, Issue , 2013, Pages 157-161

Electrical sintering characteristics of inkjet-printed conductive Ag lines on a paper substrate

(4) Jang, Shin a Lee, Dong Jun a Lee, Dohyung a Oh, Je Hoon a

Author keywords

Ag nanoparticle ink; Electrical Sintering; Grain growth; Initial resistance; Inkjet printing; Paper substrate; Resistivity

Indexed keywords

BLOWOUTS; ELECTRIC CONDUCTIVITY; GRAIN GROWTH; INK JET PRINTING; PAPER; SILVER; SUBSTRATES; VOLTAGE DISTRIBUTION MEASUREMENT;

AG NANOPARTICLE; CONDUCTIVE PATTERNS; INITIAL RESISTANCE; INPUT VOLTAGES; PAPER SUBSTRATE; PRINTED ELECTRONICS; SINTERING CHARACTERISTICS; SINTERING TIME;

SINTERING;

INK; PAPER; PRINTING; RESISTIVITY; SILVER; SINTERING; SUBSTRATES;

EID: 84885317379 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2013.05.015 Document Type: Conference Paper

Times cited : (23)

References (14)

1
- 84555177404
- S. Dasgupta, R. Kruk, N. Mechau, H. Hahn, ACS Nano 5 (2011) 9628.
- (2011) ACS Nano , vol.5 , pp. 9628
- Dasgupta, S.¹ Kruk, R.² Mechau, N.³ Hahn, H.⁴

2
- 59649111119
- H. Yan, Z.H. Chen, Y. Zheng, C. Newman, J.R. Quinn, F. Dotz, M. Kastler, A. Facchetti, Nature 457 (2009) 679.
- (2009) Nature , vol.457 , pp. 679
- Yan, H.¹ Chen, Z.H.² Zheng, Y.³ Newman, C.⁴ Quinn, J.R.⁵ Dotz, F.⁶ Kastler, M.⁷ Facchetti, A.⁸

3
- 80053618614
- A. Teichler, R. Eckardt, S. Hoeppener, C. Friebe, J. Perelaer, A. Senes, M. Morana, C.J. Brabec, U.S. Schubert, Adv. Energy Mater. 1 (2011) 105.
- (2011) Adv. Energy Mater. , vol.1 , pp. 105
- Teichler, A.¹ Eckardt, R.² Hoeppener, S.³ Friebe, C.⁴ Perelaer, J.⁵ Senes, A.⁶ Morana, M.⁷ Brabec, C.J.⁸ Schubert, U.S.⁹

4
- 61649097951
- J.U. Park, J.H. Lee, U. Paik, Y. Lu, J.A. Rogers, Nano Lett. 8 (2008) 4210.
- (2008) Nano Lett. , vol.8 , pp. 4210
- Park, J.U.¹ Lee, J.H.² Paik, U.³ Lu, Y.⁴ Rogers, J.A.⁵

5
- 38849187155
- T.H.J. van Osch, J. Perelaer, A.W.M. de Laat, U.S. Schubert, Adv. Mater. 20 (2008) 343.
- (2008) Adv. Mater. , vol.20 , pp. 343
- Van Osch, T.H.J.¹ Perelaer, J.² De Laat, A.W.M.³ Schubert, U.S.⁴

6
- 1542285058
- B.J. de Gans, P.C. Duineveld, U.S. Schubert, Adv. Mater. 16 (2004) 203.
- (2004) Adv. Mater. , vol.16 , pp. 203
- De Gans, B.J.¹ Duineveld, P.C.² Schubert, U.S.³

7
- 65149098796
- J. Perelaer, C.E. Hendriks, A.W.M. de Laat, U.S. Schubert, Nanotechnology 20 (2009) 165303.
- (2009) Nanotechnology , vol.20 , pp. 165303
- Perelaer, J.¹ Hendriks, C.E.² De Laat, A.W.M.³ Schubert, U.S.⁴

8
- 25444459649
- H.H. Lee, K.S. Chou, K.C. Huang, Nanotechnology 16 (2005) 2436.
- (2005) Nanotechnology , vol.16 , pp. 2436
- Lee, H.H.¹ Chou, K.S.² Huang, K.C.³

9
- 84855459765
- D.J. Lee, S.H. Park, S. Jang, H.S. Kim, J.H. Oh, Y.W. Song, J. Micromech. Microeng. 21 (2011) 125023.
- (2011) J. Micromech. Microeng. , vol.21 , pp. 125023
- Lee, D.J.¹ Park, S.H.² Jang, S.³ Kim, H.S.⁴ Oh, J.H.⁵ Song, Y.W.⁶

10
- 33748318116
- J. Perelaer, B.J. de Gans, U.S. Schubert, Adv. Mater. 18 (2006) 2101.
- (2006) Adv. Mater. , vol.18 , pp. 2101
- Perelaer, J.¹ De Gans, B.J.² Schubert, U.S.³

11
- 73949097996
- J. Perelaer, M. Klokkenburg, C.E. Hendriks, U.S. Schubert, Adv. Mater. 21 (2009) 4830.
- (2009) Adv. Mater. , vol.21 , pp. 4830
- Perelaer, J.¹ Klokkenburg, M.² Hendriks, C.E.³ Schubert, U.S.⁴

12
- 65949093073
- I. Reinhold, C.E. Hendriks, R. Eckardt, J.M. Kranenburg, J. Perelaer, R.R. Baumann, U.S. Schubert, J. Mater. Chem. 19 (2009) 3384.
- (2009) J. Mater. Chem. , vol.19 , pp. 3384
- Reinhold, I.¹ Hendriks, C.E.² Eckardt, R.³ Kranenburg, J.M.⁴ Perelaer, J.⁵ Baumann, R.R.⁶ Schubert, U.S.⁷

13
- 34547752436
- S.H. Ko, H. Pan, C.P. Grigoropoulos, C.K. Luscombe, J.M.J. Frechet, D. Poulikakos, Nanotechnology 18 (2007) 345202.
- (2007) Nanotechnology , vol.18 , pp. 345202
- Ko, S.H.¹ Pan, H.² Grigoropoulos, C.P.³ Luscombe, C.K.⁴ Frechet, J.M.J.⁵ Poulikakos, D.⁶

14
- 77951731621
- S. Magdassi, M. Grouchko, O. Berezin, A. Kamyshny, Acs Nano 4 (2010) 1943.
- (2010) Acs Nano , vol.4 , pp. 1943
- Magdassi, S.¹ Grouchko, M.² Berezin, O.³ Kamyshny, A.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.