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Volumn 1998-March, Issue , 1998, Pages 213-223
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Event-driven verification of switch-level correctness concerns
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Author keywords
[No Author keywords available]
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Indexed keywords
SYSTEMS ANALYSIS;
CIRCUIT SPECIFICATIONS;
EVENT-DRIVEN;
MOS CIRCUITS;
SELF-TIMED;
SIGNAL LEVEL;
SIGNAL TRANSITION;
DELAY CIRCUITS;
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EID: 84885231073
PISSN: 15504808
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/CSD.1998.657553 Document Type: Conference Paper |
Times cited : (4)
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References (15)
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