General analysis of microwave network scattering parameters for characterization of thin film materials

Measurement: Journal of the International Measurement Confederation

Volumn 46, Issue 8, 2013, Pages 2963-2970

  Obrzut, Jan ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Coplanar waveguides; Microwave conductivity; Microwave networks; Network model; Scattering parameters; Thin films

Indexed keywords

COPLANAR WAVEGUIDES; MICROWAVES; SCATTERING; SCATTERING PARAMETERS; THIN FILMS;

COAXIAL CONFIGURATION; COPLANAR WAVEGUIDE CONFIGURATIONS; GENERAL NETWORK MODEL; MATHEMATICAL FORMULAS; MICROWAVE CONDUCTIVITY; MICROWAVE NETWORKS; NETWORK MODELING; TRANSMISSION REFLECTION;

CHARACTERIZATION;

EID: 84885176934     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2013.04.049     Document Type: Article

References (28)

1. A. Gensbittel, A.F. Degardin, F. Weiss, A.J. Kreisler, Tunable coplanar waveguide microwave devices on MOCVD-SrTiO3 thin films, Ferroelectrics 362 (2008) 48-56.
2. D.O. Guney, T. Koschny, C.M. Soukoulis, Surface plasmon driven electric and magnetic resonators for MTA materials, Phys. Rev. B 83 (2011) 045107.
3. W. Chen, M.D. Thoreson, A.V. Kildishev, V.M. Shalaev, Fabrication and optical characterizations of smooth silver-silica nanocomposite films, Laser Phys. Lett. 7 (2010) 677-684.
4. A. Thoman, A. Kern, H. Helm, M. Walther, Nanostructure gold films a broadband terahertz antireflection coatings, Phys. Rev. B 77 (2008) 195405.
5. L. Finkelstein, Widely defined measurement - an analysis of challenges, Measurement 42 (2009) 1270-1277.
6. I.V. Antonets, L.N. Kotov, S.V. Nekipelov, E.N. Karpushov, Conducting and reflecting properties of thin metal films, Technic. Phys. 49 (2004) 1496-1500.
7. J.C. Booth, D.H. Wu, S.M. Anlage, A broadband method for the measurement of surface impedance at microwave frequencies, Rev. Sci. Instr. 65 (1994) 2082-2090.
8. Y. Poo, R. Wu, J.Q. Xiao, Measurement of AC conductivity of gold nanofilms at microwave frequencies, Rev. Sci. Instr. 81 (2010) 064701.
9. S. Shalin, Microscopic theory of optical properties of composite media with chaotically distributed nanoparticles, Quantum Electron. 40 (2010) 1004-1011.
10. V. Tripathi, Y.L. Loh, Frequency and temperature dependence of the optical conductivity of granular metals: A path-integral approach, Phys. Rev. B 73 (15) (2006) 195113.
11. R.J. Collier, A.D. Skinner, Microwave Measurements, The Institution of Engineering Technology, UK, 2007.
12. J.K. Hunton, Analysis of microwave measurement techniques by means of signal flow graphs, IRE Trans. Microw. Theory Technol. 8 (1960) 206-212.
13. K. Kurokawa, Power waves and the scattering matrix, IEEE Trans. Microwave Theory and Tech. 13 (1965) 194-202.
14. J. Obrzut, Measurement of dielectric properties, in: H. Czichos, T. Saito, L. Smith (Eds.), Springer Handbook of Metrology and Testing, Springer Science, Heidelberg, 2011, p. 532.
15. J. Mason, Feedback theory-further properties of signal flow graphs, Proc. IRE 44 (1956) 920-926.
16. A.M. Nicolson, Measurement of the intrinsic properties of materials by time-domain technique, IEEE Trans. Instr. Meas. 19 (1970) 377-382.
17. S. Rao, J.R. Whinnery, T. Van Duzer, Communication Electronics, J. Wiley, New York, 1993. pp. 414.
18. W.R. Eisenstadt, Y. Eo, S-Parameter-Based IC Interconnect Transmission Line Characterization, IEEE Trans. Compo., Hybr. Manufact. Tech. 15 (1992) 483-490.
19. M.A. Stuchly, S.S. Stuchly, Coaxial line reflection methods for measuring dielectric properties of biological substances at radio and microwave frequencies - a review, IEEE Trans. Instr. Meas. 27 (1978) 176-183.
20. J. Obrzut, A. Anopchenko, Input impedance of coaxial line terminated with a complex gap capacitance - numerical and experimental analysis, IEEE Trans. Instr. Meas. 53 (2004) 1197-1201.
21. S.H. Khan, L. Finkelstein, Mathematical modeling in measurement and instrumentation, Measurement 34 (2001) 261-266.
22. M.D. Janezic, D.F. Williams, Permittivity characterization from transmission-line measurement, IEEE MTT-S Int. Microw. Symp. Digest. 3 (1977) 1343-1346.
23. V. Milanovic, M. Ozgur, D.C. DeGroot, J.A. Jargon, M. Gaitan, M.E. Zaghloul, Characterization of broad-band transmission for coplanar waveguides on CMOS silicon substrates, IEEE Trans. Microw. Theor. Technol. 46 (1998) 632-639.
24. M. Walther, D.G. Cooke, C. Sherstan, M. Hajar, M.R. Freeman, F.A. Hegmann, Terahertz conductivity of thin gold films at the metalinsulator percolation transition, Phys. Rev. B 76 (2007) 125408.
25. J. Obrzut, J.F. Douglas, Measurement of complex conductivity in carbon nanotube polymer composites under mechanical shear, Metrol. Meas. Sys. 76 (2008) 399-407.
26. J. Obrzut, K. Page, Electrical conductivity and relaxation in poly(3-hexylthiophene), Phys. Rev. B 80 (2009) 195211.
27. W. Heinrich, Quasi-TEM description of MMIC coplanar lines including conductor-loss effects, IEEE Trans. Microw. Theory Technol. 41 (1993) 45-52.
28. D. Gu, T.M. Wallis, P. Blanchard, S.H. Lim, A. Imtiaz, K.A. Bertness, N.A. Sanford, P. Kabos, De-embedding parasitic elements of GaN nanowire metal semiconductor field effect transistors by use of microwave measurements, Appl. Phys. Lett. 98 (2011) 23109.