An atom trap trace analysis system for measuring krypton contamination in xenon dark matter detectors

Review of Scientific Instruments

Volumn 84, Issue 9, 2013, Pages

  Aprile, E ^a   Yoon, T ^a   Loose, A ^a   Goetzke, L W ^a   Zelevinsky, T ^a  

^a Columbia University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYSIS SYSTEM; CURRENT GENERATION; DARK MATTER DETECTORS; DETECTION MODE; MAGNETO-OPTICAL; METASTABLE ATOMS; RADIO FREQUENCY PLASMA; SYSTEM EFFICIENCY;

ELECTRIC DISCHARGES; GALAXIES; TRACE ANALYSIS;

ATOMS;

EID: 84885117729     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4821879     Document Type: Article

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