Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy

Applied Physics Letters

Volumn 103, Issue 4, 2013, Pages

  Kong, X H ^a   Ji, H X ^a   Piner, R D ^a   Li, H F ^a   Magnuson, C W ^a   Tan, C ^a   Ismach, A ^a   Chou, H ^a   Ruoff, R S ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADDITIONAL TREATMENT; CHEMICAL VAPOR DEPOSITION GRAPHENE; DIFFERENT HEIGHTS; DIFFERENT THICKNESS; GROWTH SUBSTRATES; IMPROVED CONTRASTS; NON DESTRUCTIVE; OPTICAL IMAGING;

CHEMICAL VAPOR DEPOSITION; COPPER; OPTICAL DATA STORAGE; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; VAPORS;

GRAPHENE;

EID: 84885014385     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4816752     Document Type: Article

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