Origin of stress and enhanced carrier transport in solution-cast organic semiconductor films

Journal of Applied Physics

Volumn 114, Issue 9, 2013, Pages

  Cour, Ishviene ^a   Chinta, Priya V ^a   Schlepütz, Christian M ^b   Yang, Yongsoo ^c   Clarke, Roy ^c   Pindak, Ron ^d   Headrick, Randall L ^a  

^a UNIVERSITY OF VERMONT   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION CONDITIONS; OPTICAL VIDEO MICROSCOPY; OPTIMIZED CONDITIONS; ORGANIC SEMICONDUCTOR FILMS; SOLUTION CONCENTRATION; SOLVENT EVAPORATION; SUBSTRATE TEMPERATURE; SYNCHROTRON X-RAY SCATTERING;

ORGANIC FIELD EFFECT TRANSISTORS; THIN FILMS;

DEPOSITION;

EID: 84884960613     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4820384     Document Type: Article

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