Analysis of smearing-out in contribution plot based fault isolation for Statistical Process Control

Chemical Engineering Science

Volumn 104, Issue , 2013, Pages 285-293

  Van Den Kerkhof, Pieter ^a   Vanlaer, Jef ^a   Gins, Geert ^a   Van Impe, Jan F M ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Chemical processes; Contribution plots; Fault detection isolation; Mathematical modelling; Process control; Remediation

Indexed keywords

MATHEMATICAL MODELS; PROCESS CONTROL; REMEDIATION; STATISTICAL PROCESS CONTROL;

CHEMICAL PROCESS; CONTRIBUTION PLOTS; FAULT ISOLATION RATES; ISOLATION PERFORMANCE; NUMBER OF PRINCIPAL COMPONENTS; PARTIAL DECOMPOSITION; PHYSICAL INTERPRETATION; STATISTICAL PROCESS CONTROLS (SPC);

PRINCIPAL COMPONENT ANALYSIS;

EID: 84884928551     PISSN: 00092509     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ces.2013.08.007     Document Type: Article

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