Enhanced photocurrent in solution processed electronically coupled CdSe nanocrystals thin films

Applied Physics Letters

Volumn 103, Issue 12, 2013, Pages

  Dondapati, Hareesh ^a   Ha, Duc ^a   Pradhan, A K ^a  

^a NORFOLK STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION TECHNIQUE; ELECTRON COUPLING; ETHANEDITHIOL (EDT); INTERPARTICLE DISTANCES; NANOCRYSTAL (NCS); ORDERS OF MAGNITUDE; SEMICONDUCTOR FILMS; SOLUTION-PROCESSED;

DEPOSITION;

NANOCRYSTALS;

EID: 84884876511     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4822094     Document Type: Article

References (20)

1. E. Talgorn, R. D. Abellon, P. J. Kooyman, J. Piris, T. J. Savenije, A. Goossens, A. J. Houtepen, and L. D. A. Siebbeles, ACS Nano 4, 1723 (2010). 10.1021/nn901709a
2. G. Konstantatos, I. Howard, A. Fischer, S. Hoogland, J. Clifford, E. Klem, L. Levina, and E. H. Sargent, Nature 442, 180 (2006). 10.1038/nature04855
3. R. D. Schaller and V. I. Klimov, Phys. Rev. Lett. 92, 186601 (2004). 10.1103/PhysRevLett.92.186601
4. R. J. Ellingson, M. C. Beard, J. C. Johnson, P. Yu, O. I. Micic, A. J. Nozik, A. Shabaev, and A. L. Efros, Nano Lett. 5, 865 (2005). 10.1021/nl0502672
5. Y. Liu, M. Gibbs, J. Puthussery, S. Gaik, R. Ihly, H. W. Hillhouse, and M. Law, Nano Lett. 10, 1960 (2010). 10.1021/nl101284k
6. S. Geyer, V. J. Porter, J. E. Halpert, T. S. Mentzel, M. A. Kastner, and M. G. Bawendi, Phys. Rev. B 82, 155201 (2010). 10.1103/PhysRevB.82.155201
7. C. B. Murray, C. R. Kagan, and M. G. Bawendi, Annu. Rev. Mater. Sci. 30, 545 (2000). 10.1146/annurev.matsci.30.1.545
8. W. Liu, J. S. Lee, and D. V. Talapin, J. Am. Chem. Soc. 135, 1349 (2013). 10.1021/ja308200f
9. M. V. Kovalenko, M. I. Bodnarchuk, J. Zaumseil, J. S. Lee, and D. V. Talapin, J. Am. Chem. Soc. 132, 10085 (2010). 10.1021/ja1024832
10. M. Law, J. M. Luther, Q. Song, B. K. Hughes, C. L. Perkins, and A. J. Nozik, J. Am. Chem. Soc. 130, 5974 (2008). 10.1021/ja800040c
11. D. V. Talapin and C. B. Murray, Science 310, 86 (2005). 10.1126/science.1116703
12. R. Koole, P. Liljeroth, C. D. Donega, D. Vanmaekelbergh, and A. Meijerink, J. Am. Chem. Soc. 128, 10436 (2006). 10.1021/ja061608w
13. J. M. Luther, M. Law, Q. Song, C. L. Perkins, M. C. Beard, and A. J. Nozik, ACS Nano 2, 271 (2008). 10.1021/nn7003348
14. J. M. Luther, M. Law, M. C. Beard, Q. Song, M. O. Reese, R. J. Ellingson, and A. J. Nozik, Nano Lett. 8, 3488 (2008). 10.1021/nl802476m
15. D. V. Talapin, J. H. Nelson, E. V. Shevchenko, S. Aloni, B. Sadtler, and A. P. Alivisatos, Nano Lett. 7, 2951 (2007). 10.1021/nl072003g
16. J. S. Lee, M. V. Kovalenko, J. Huang, D. S. Chung, and D. V. Talapin, Nat. Nanotechnol. 6, 348 (2011). 10.1038/nnano.2011.46
17. Y. Q. Zhang and X. A. Cao, Nanotechnology 23, 275702 (2012). 10.1088/0957-4484/23/27/275702
18. Y. Q. Zhang and X. A. Cao, Appl. Phys. Lett. 99, 023106 (2011). 10.1063/1.3610456
19. M. Drndic, M. V. Jarosz, N. Y. Morgan, M. A. Kastner, and M. G. Bawendi, J. Appl. Phys. 92, 7498 (2002). 10.1063/1.1523148
20. F. Remacle, J. Phys. Chem. A 104, 4739 (2000). 10.1021/jp993494z